DocumentCode
2382549
Title
A method for reducing the effects of random mismatches in CMOS bandgap references
Author
Ceekala, V.G. ; Lewicki, L.D. ; Wieser, J.B. ; Varadarajan, D. ; Mohan, J.
Author_Institution
Nat. Semicond. Corp., Sunnyvale, CA, USA
Volume
1
fYear
2002
fDate
7-7 Feb. 2002
Firstpage
392
Abstract
A method for reducing the effects of random mismatches in CMOS bandgap references reduces effects of CMOS current-mirror offsets and input-referred offsets of CMOS opamps. The circuit is fabricated in a 0.18 /spl mu/m CMOS process. Measured 3 sigma output voltage distribution is /spl sim/1%.
Keywords
CMOS analogue integrated circuits; current mirrors; reference circuits; 0.18 micron; 3 sigma output voltage distribution; CMOS; bandgap references; current-mirror offsets; input-referred offsets; opamps; random mismatches; Circuits; Current density; Equations; Fingers; Mirrors; Photonic band gap; Substrates; Switches; Temperature; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location
San Francisco, CA, USA
Print_ISBN
0-7803-7335-9
Type
conf
DOI
10.1109/ISSCC.2002.993097
Filename
993097
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