Title :
A method for reducing the effects of random mismatches in CMOS bandgap references
Author :
Ceekala, V.G. ; Lewicki, L.D. ; Wieser, J.B. ; Varadarajan, D. ; Mohan, J.
Author_Institution :
Nat. Semicond. Corp., Sunnyvale, CA, USA
Abstract :
A method for reducing the effects of random mismatches in CMOS bandgap references reduces effects of CMOS current-mirror offsets and input-referred offsets of CMOS opamps. The circuit is fabricated in a 0.18 /spl mu/m CMOS process. Measured 3 sigma output voltage distribution is /spl sim/1%.
Keywords :
CMOS analogue integrated circuits; current mirrors; reference circuits; 0.18 micron; 3 sigma output voltage distribution; CMOS; bandgap references; current-mirror offsets; input-referred offsets; opamps; random mismatches; Circuits; Current density; Equations; Fingers; Mirrors; Photonic band gap; Substrates; Switches; Temperature; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2002. Digest of Technical Papers. ISSCC. 2002 IEEE International
Conference_Location :
San Francisco, CA, USA
Print_ISBN :
0-7803-7335-9
DOI :
10.1109/ISSCC.2002.993097
