• DocumentCode
    2382819
  • Title

    Optimal parametric discrete event control: Problem and solution

  • Author

    Griffin, Christopher

  • Author_Institution
    Oak Ridge Nat. Lab., Oak Ridge, TN
  • fYear
    2008
  • fDate
    11-13 June 2008
  • Firstpage
    1166
  • Lastpage
    1171
  • Abstract
    We present a novel optimization problem for discrete event control, similar in spirit to the optimal parametric control problem common in statistical process control. In our problem, we assume a known finite state machine plant model G defined over an event alphabet Sigma so that the plant model language L = LM(G) is prefix closed. We further assume the existence of a base control structure MK, which may be either a finite state machine or a deterministic pushdown machine. If K = LM(MK), we assume K is prefix closed and that K C L. We associate each controllable transition of MK with a binary variable X1,..., Xnmiddot indicating whether the transition is enabled or not. This leads to a function MK(X1, ,...,- , Xn), that returns a new control specification depending upon the values of X1,..., Xnmiddot We exhibit a branch-and-bound algorithm to solve the optimization problem minx1 x,...xn &maxwwepsiK C(w) such that MK(X1,...,Xn) = |= and LM(MK(X1,...,- , Xnmiddot)) epsi C(L). Here . is a set of logical assertions on the structure of MK(X1, X1,...,- , Xnmiddot), and MK(X1,...,- , Xnmiddot) = || indicates that MK(X1,...,- , Xn) satisfies the logical assertions; and, C(L) is the set of controllable sublanguages of L1.
  • Keywords
    discrete event systems; finite state machines; optimal control; optimisation; tree searching; base control structure; branch-and-bound algorithm; deterministic pushdown machine; discrete event control; finite state machine plant model; logical assertions; optimal parametric control; optimization problem; statistical process control; Automata; Contracts; Controllability; Laboratories; Optimal control; Process control; Supervisory control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2008
  • Conference_Location
    Seattle, WA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-2078-0
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2008.4586650
  • Filename
    4586650