DocumentCode :
238294
Title :
Reliability of different levels of cascaded H-Bridge inverter: An investigation and comparison
Author :
Hardas, R.G. ; Munshi, A.P. ; Kadwane, S.G.
Author_Institution :
Dept. of Electr. Eng., Yeshwantrao Chavan Coll. of Eng., Nagpur, India
fYear :
2014
fDate :
8-10 May 2014
Firstpage :
349
Lastpage :
354
Abstract :
This paper presents the comparative analysis of reliability of different levels of cascaded H-Bridge inverter topologies. Failure of single IGBT in a cell of H-Bridge can determine the reliability of the complete cell. Military Handbook-217F provides basis for computation of reliability of semiconductors. This method is not applicable for reliability evaluation of IGBT. To determine the temperature cycles of IGBT, thermal impedance model is developed and power cycles are obtained by using transfer function in MATLAB simulation. By Coffin-Manson fatigue life relationship, the number of temperature cycles is detected by MATLAB programming. An algorithm is used to correlate number of temperature cycles with failure rate. Mean time to failure (MTTF) of each model is compared. It was observed that reliability increases with increase in number of levels of multilevel inverter.
Keywords :
bridge circuits; failure analysis; insulated gate bipolar transistors; invertors; semiconductor device reliability; thermal resistance; transfer functions; Coffin-Manson fatigue life relationship; IGBT failure; MTTF; cascaded H-bridge inverter topology reliability; insulated gate bipolar transistor; mean time to failure; military handbook-217F; power cycle; semiconductor reliability computation; thermal impedance model; transfer function; Bridge circuits; Insulated gate bipolar transistors; MATLAB; Reliability; Stress; Switches; Thermal analysis; Insulated Gate Bipolar transistor (IGBT); Mean time to failure (MTTF); Reliability; temperature cycle; thermal impedance;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Communication Control and Computing Technologies (ICACCCT), 2014 International Conference on
Conference_Location :
Ramanathapuram
Print_ISBN :
978-1-4799-3913-8
Type :
conf
DOI :
10.1109/ICACCCT.2014.7019461
Filename :
7019461
Link To Document :
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