DocumentCode :
2383008
Title :
Thermomechanical behavior of BGA solder joints under vibrations: an experimental observation
Author :
Zhao, Y. ; Basaran, C. ; Cartwright, A. ; Dishongh, T.
Author_Institution :
Electron. Packaging Lab., State Univ. of New York, Buffalo, NY, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
349
Abstract :
Recent trends in reliability and fatigue life analysis of electronic devices have involved developing structural integrity models for predicting the operating lifetime under vibratory and thermal environmental exposure. Solder joint reliability is the most critical issue for the structural integrity of surface mounted electronics. Extensive research has been done on thermal behavior of solder joints, however, dynamic loading effects on solder joint fatigue life have not been thoroughly investigated. The physics of solder joint failure under vibration is still not very clear. This paper presents a test program which was performed to study inelastic behavior of solder joints of BGA packages. A concurrent loading unit is used which consists of a thermal environmental chamber and an electrodynamic shaker. Laser Moire Interferometry was used to measure the whole deformation field of the prepared specimen surface. The corresponding inelastic strain field is then calculated. It is found that at elevated temperature, vibration and shock can cause the accumulation of inelastic strains and damage in solder joints. In this paper, contrary to the popular belief that all vibration-induced strains are elastic, it is shown that vibration can cause significant inelastic strains
Keywords :
ball grid arrays; circuit reliability; failure analysis; fatigue testing; integrated circuit packaging; light interferometry; mechanical strength; soldering; stress analysis; stress-strain relations; thermal analysis; BGA packages; BGA solder joints; concurrent loading unit; deformation field; dynamic loading effects; electrodynamic shaker; elevated temperature; fatigue life analysis; inelastic behavior; inelastic strain field; inelastic strains; laser Moire interferometry; shock; solder joint failure; solder joint fatigue life; solder joint reliability; structural integrity; surface mounted electronics; test program; thermal environmental chamber; thermomechanical behavior; vibration-induced strains; vibrations; Capacitive sensors; Electronic packaging thermal management; Fatigue; Performance evaluation; Physics; Predictive models; Soldering; Testing; Thermal loading; Thermomechanical processes;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
Conference_Location :
Las Vegas, NV
ISSN :
1089-9870
Print_ISBN :
0-7803-5912-7
Type :
conf
DOI :
10.1109/ITHERM.2000.866213
Filename :
866213
Link To Document :
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