• DocumentCode
    2383039
  • Title

    Mechanical characterization of solder mask materials in electronic packaging applications

  • Author

    Zhu, Han ; Guo, Yifan ; Li, Wen-Ying ; Tseng, Ampere A.

  • Author_Institution
    Dept. of Civil & Environ. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    362
  • Abstract
    Mechanical properties of solder masks are critical in the reliability performance of flip-chip packages. Many recent studies show that the mechanical properties of solder mask materials have great influence on moisture absorption, delamination at interconnections and solder fatigue life in flip-chip packages. There are also assembly process issues related to the properties of solder masks. In this article, an experimental investigation that mechanically characterizes solder one mask material is conducted. Mechanical properties such as Young´s modulus, failure strength and creep behaviors are determined based on the measured data from the experiments. The testing temperature is set at two levels: 25°C and 80°C. The major instrument is a sophisticated micromechanical tester
  • Keywords
    Young´s modulus; creep; delamination; fatigue; flip-chip devices; integrated circuit packaging; integrated circuit reliability; masks; moisture; soldering; 25 degC; 80 degC; Young´s modulus; assembly process issues; creep behaviors; delamination; electronic packaging applications; failure strength; flip-chip packages; mechanical characterization; micromechanical tester; moisture absorption; reliability performance; solder fatigue life; solder mask materials; testing temperature; Absorption; Assembly; Conducting materials; Creep; Delamination; Electronics packaging; Fatigue; Mechanical factors; Moisture; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2000. ITHERM 2000. The Seventh Intersociety Conference on
  • Conference_Location
    Las Vegas, NV
  • ISSN
    1089-9870
  • Print_ISBN
    0-7803-5912-7
  • Type

    conf

  • DOI
    10.1109/ITHERM.2000.866215
  • Filename
    866215