Title :
A new refractometer by combining a variable length vacuum cell and a double-pass Michelson interferometer
Author :
Fujii, K. ; Williams, E.R. ; Steiner, R.L.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Abstract :
A new refractometer with a variable length vacuum cell has been developed, where the refractive index of air is determined by measuring the changes in the optical path difference between the air of interest and a vacuum as a function of the changes in the cell length. An uncertainty of 4/spl times/10/sup -9/ in the index has been achieved.
Keywords :
Michelson interferometers; air; refractive index; refractive index measurement; refractometers; SI watt experiment; air; dark fringe detection; double-pass Michelson interferometer; optical path difference; phase modulation; refractive index; refractometer; uncertainty; variable length vacuum cell; Interference; Laser beams; Length measurement; NIST; Optical interferometry; Optical polarization; Optical refraction; Optical variables control; Refractive index; Vacuum technology;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546651
