Title :
Ten-volt Josephson junction array voltage standard at ETL
Author :
Murayama, Y. ; Sakuraba, T. ; Sakamoto, Y. ; Yoshida, H. ; Kozakai, T. ; Endo, T.
Author_Institution :
Electrotech. Lab., Ibaraki, Japan
Abstract :
A voltage standard system using a 10-V Josephson junction array has been developed. The uncertainty is 0.6/spl times/10/sup -8/ for measurement of the 10-V output Zener diode reference standard. A comparison of the 10-V array system with the conventional 10-V measurement system composed of a 1-V array and a voltage divider was performed through measurements of a 10-V output of a Zener. The result agreed within the uncertainty (/spl sim/1/spl times/10/sup -8/) of the comparison.
Keywords :
Josephson effect; Zener diodes; aluminium compounds; calibration; critical current density (superconductivity); measurement standards; millimetre wave measurement; niobium; superconductor-insulator-superconductor devices; voltage measurement; 10 V; ETL; Josephson junction array; Nb-AlO-Nb; Zener diode reference standard; calibration; critical current density; mm-wave measurement; uncertainty; voltage standard; Circuits; Electrical resistance measurement; Filters; Frequency measurement; Josephson junctions; Millimeter wave measurements; Noise measurement; Pollution measurement; Relays; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546660
