DocumentCode
2383346
Title
Predicting software defects: A cost-sensitive approach
Author
Bezerra, Miguel E R ; Oliveiray, Adriano L I ; Adeodato, Paulo J L
Author_Institution
Center of Inf., Fed. Univ. of Pernambuco, Recife, Brazil
fYear
2011
fDate
9-12 Oct. 2011
Firstpage
2515
Lastpage
2522
Abstract
Find software defects is a complex and slow task which consumes most of the development budgets. In order to try reducing the cost of test activities, many researches have used machine learning to predict whether a module is defect-prone or not. Defect detection is a cost-sensitive task whereby a misclassification is more costly than a correct classification. Yet, most of the researches do not consider classification costs in the prediction models. This paper introduces an empirical method based in a COCOMO (COnstructive COst MOdel) that aims to assess the cost of each classifier decision. This method creates a cost matrix that is used in conjunction with a threshold-moving approach in a ROC (Receiver Operating Characteristic) curve to select the best operating point regarding cost. Public data sets from NASA (National Aeronautics and Space Administration) IV&V (Independent Verification & Validation) Facility Metrics Data Program (MDP) are used to train the classifiers and to provide some development effort information. The experiments are carried out through a methodology that complies with validation and reproducibility requirements. The experimental results have shown that the proposed method is efficient and allows the interpretation of the classifier performance in terms of tangible cost values.
Keywords
cost reduction; learning (artificial intelligence); matrix algebra; program debugging; program testing; software cost estimation; constructive cost model; cost matrix; cost reduction; cost-sensitive approach; defect detection; empirical method; machine learning; receiver operating characteristic curve; software defect prediction; threshold-moving approach; Equations; Mathematical model; NASA; Neurons; Software; Testing; Training; COCOMO; Defect prediction; MDP; NASA; ROC curve; machine learning; pattern recognition; software metrics; testing costs;
fLanguage
English
Publisher
ieee
Conference_Titel
Systems, Man, and Cybernetics (SMC), 2011 IEEE International Conference on
Conference_Location
Anchorage, AK
ISSN
1062-922X
Print_ISBN
978-1-4577-0652-3
Type
conf
DOI
10.1109/ICSMC.2011.6084055
Filename
6084055
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