Title :
Second order approximation lumped parameter model for planar integrated L-L-C-T module [power conversion]
Author :
Chen, Rengang ; Strydom, Johan T. ; van Wyk, J.D.
Author_Institution :
Bradley Dept. of Electr. & Comput. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
Abstract :
Planar integrated L-L-C-T (inductor-inductor-capacitor-transformer) technology has been the subject of intensive research over the last few years. Research of modeling and explaining its behavior in different power electronic circuits has been conducted. However, most of the previous models are based on first order approximation. High frequency characteristics of L-L-C-T cannot be modeled by those models. A second order approximation lumped parameter equivalent circuit of L-L-C-T is proposed in this paper. This model can describe the characteristics of L-L-C-T up to the third resonant frequency. The parameters of the model can be either extracted from small signal measurement or calculated from the L-L-C-T geometry structure. The proposed model is used to analyze the secondary voltage ringing of an asymmetrical half-bridge converter (AHBC) in distributed power system (DPS) applications. The predicted result matches the measurement result well.
Keywords :
approximation theory; bridge circuits; circuit resonance; lumped parameter networks; power capacitors; power inductors; power transformers; resonant power convertors; L-L-C-T geometry structure; asymmetrical half-bridge converter; distributed power system; planar integrated L-L-C-T module; power electronic circuits; resonant power conversion; second order approximation lumped parameter model; small signal measurement; third resonant frequency; Equivalent circuits; Geometry; Integrated circuit technology; Power conversion; Power electronics; Power system analysis computing; Power system modeling; Resonant frequency; Solid modeling; Voltage;
Conference_Titel :
Industry Applications Conference, 2002. 37th IAS Annual Meeting. Conference Record of the
Conference_Location :
Pittsburgh, PA, USA
Print_ISBN :
0-7803-7420-7
DOI :
10.1109/IAS.2002.1042784