• DocumentCode
    2383612
  • Title

    Gate controlled 2-DEG varactor for VCO applications in microwave circuits

  • Author

    Anwar, Amro ; Nabet, Bahram ; Culp, James

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Drexel Univ., Philadelphia, PA, USA
  • Volume
    2
  • fYear
    1999
  • fDate
    1999
  • Firstpage
    585
  • Abstract
    A novel gate-controlled Schottky diode varactor is introduced. The three terminal varactor is a modulation doped heterostructure of AlGaAs-GaAs with two Schottky contacts, similar to a metal-semiconductor-metal (MSM) diode. Schottky metal contacts are made to a two dimensional electron gas (2-DEG). The third, gate, contact is formed from highly doped n+ GaAs material to allow an open optical window that can be used for optical gating and mixing. Structure capacitance is less than 1 pF and a change of more than 30 percent from the zero bias capacitance is observed with the applied gate voltage. The interdigital structure dimensions can be scaled to cover a wide range of operation in the microwave and millimeter wave regimes
  • Keywords
    III-V semiconductors; Schottky diodes; aluminium compounds; gallium arsenide; microwave diodes; microwave oscillators; microwave photonics; optical control; two-dimensional electron gas; varactors; voltage-controlled oscillators; 1 pF; AlGaAs-GaAs; AlGaAs/GaAs structure; Schottky diode varactor; Schottky metal contacts; VCO applications; gate controlled 2DEG varactor; highly doped n+ GaAs material contact; interdigital structure; microwave circuits; modulation doped heterostructure; open optical window; optical gating; optical mixing; three terminal varactor; two dimensional electron gas; Capacitance; Electron optics; Epitaxial layers; Gallium arsenide; Optical materials; Optical mixing; Schottky barriers; Schottky diodes; Varactors; Voltage-controlled oscillators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave and Optoelectronics Conference, 1999. SBMO/IEEE MTT-S, APS and LEOS - IMOC '99. International
  • Conference_Location
    Rio de Janeiro
  • Print_ISBN
    0-7803-5807-4
  • Type

    conf

  • DOI
    10.1109/IMOC.1999.866249
  • Filename
    866249