DocumentCode
2383646
Title
Testing Patterns
Author
Soundarajan, N. ; Hallstrom, Jason O. ; Delibas, A. ; Guoqiang Shu
Author_Institution
Ohio State Univ., Columbus
fYear
2007
fDate
March 6 2007-Feb. 8 2007
Firstpage
109
Lastpage
120
Abstract
After over a decade of use, design patterns continue to find new areas of application. In previous work, we presented a contract formalism for specifying patterns precisely, and showed how the use of the formalism can amplify the benefits of patterns. In this paper, our goal is to enable practitioners to test whether their systems, as implemented, meet the requirements, as specified in the pattern contracts, corresponding to the correct usage of the patterns underlying the systems´ designs. In our testing approach, corresponding to each design pattern, there is a set of what we call pattern test case templates (PTCTs). A PTCT codifies a reusable test case structure designed to identify defects associated with applications of the particular pattern. The test assertions in the PTCT are based on the requirements specified in the appropriate pattern contract. Next we present a process using which, given any system designed using the pattern, the system tester can generate a test suite from the PTCTs for that pattern that can be used to test the system for bugs in the implementation of the particular pattern. The process allows the system tester to tailor the test suite the needs of the individual system by specifying a set of specialization rules that are designed to reflect the structure and the scenarios in which the defects codified in the PTCTs are likely to manifest themselves in the particular system.
Keywords
formal specification; object-oriented programming; program testing; contract formalism; design patterns; pattern test case templates; patterns specification; reusable test case structure; testing patterns; Acoustic testing; Acoustical engineering; Application software; Computer bugs; Computer science; Contracts; Design engineering; Subcontracting; System testing; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
Software Engineering Workshop, 2007. SEW 2007. 31st IEEE
Conference_Location
Columbia, MD
ISSN
1550-6215
Print_ISBN
978-0-7695-2862-5
Type
conf
DOI
10.1109/SEW.2007.108
Filename
4402770
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