Title :
Measurement of the resonance frequency of contactless IC cards using an electro-optic-sampling probe
Author :
Tsuru, Koji ; Murata, Koushi ; Ohtani, Yoshimitsu ; Nagai, Yasuhiro ; Shinagawa, Mitsuru
Author_Institution :
NTT Cyber Space Lab., Tokyo, Japan
Abstract :
We present a novel method of measuring the resonance frequency of contactless IC cards, which has been difficult to determine accurately, because of electromagnetic coupling between the antenna in the card and the measuring probe, even though it is a very important factor related to energy and data transmission. Using an electro-optic-sampling (EOS) probe, we made precise measurements of the resonance frequency without any influence from electromagnetic coupling
Keywords :
electro-optical devices; frequency measurement; integrated circuit measurement; probes; smart cards; EOS probe; contactless IC cards; electro-optic-sampling probe; precise measurements; resonance frequency measurement; Antenna measurements; Data communication; Electromagnetic coupling; Electromagnetic measurements; Energy measurement; Frequency measurement; Probes; Resonance; Resonant frequency; Transmitting antennas;
Conference_Titel :
Microwave and Optoelectronics Conference, 1999. SBMO/IEEE MTT-S, APS and LEOS - IMOC '99. International
Conference_Location :
Rio de Janeiro
Print_ISBN :
0-7803-5807-4
DOI :
10.1109/IMOC.1999.866263
