Title :
A new approach to feature extraction for wavelet-based texture classification
Author :
Mittelman, Roni ; Porat, Moshe
Author_Institution :
Dept. of Electr. Eng., Technion-Israel Inst. of Technol., Haifa, Israel
Abstract :
A new class of features for wavelet-based texture classification is introduced using a new feature-weighting scheme adapted to non-Euclidean similarity measures. The feature extraction is based on the histogram of the local second moment estimates of the wavelet transform. It is shown that the bins´ centers of such histograms should be scaled logarithmically rather than linearly. The distance between two texture features is measured using the x2 similarity measure, weighted according to the feature´s degree of dispersion within the training dataset. Classification experiments of the proposed approach using an orthonormal wavelet transform show improved classification results compared to presently available methods.
Keywords :
feature extraction; image classification; image texture; wavelet transforms; feature extraction; feature-weighting scheme; local second moment; nonEuclidean similarity measures; training dataset; wavelet transform; wavelet-based texture classification; Feature extraction; Filtering; GSM; Hidden Markov models; Higher order statistics; Histograms; Maximum likelihood estimation; Smoothing methods; Statistical distributions; Wavelet transforms;
Conference_Titel :
Image Processing, 2005. ICIP 2005. IEEE International Conference on
Print_ISBN :
0-7803-9134-9
DOI :
10.1109/ICIP.2005.1530595