• DocumentCode
    2384280
  • Title

    Influence of the contact resistance on precision measurements of the quantum Hall effect

  • Author

    Jeckelmann, B. ; Jeanneret, B.

  • Author_Institution
    Swiss Fed. Office of Metrol., Wabern, Switzerland
  • fYear
    1996
  • fDate
    17-21 June 1996
  • Firstpage
    157
  • Lastpage
    158
  • Abstract
    The influence of the contacts on the precision of the quantized Hall resistance is studied in a series of high precision measurements. Deviations of the Hall resistance of up to 0.35 ppm from the expected values are observed if the resistance of one of the voltage contacts is comparable to the Hall resistance.
  • Keywords
    contact resistance; electric resistance measurement; electrical contacts; measurement standards; quantum Hall effect; contact resistance; precision measurements; quantized Hall resistance; quantum Hall effect; voltage contacts; Contact resistance; Current measurement; Electrical resistance measurement; Electrons; Gallium arsenide; Geometry; Hall effect; Metrology; Probes; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements Digest, 1996 Conference on
  • Conference_Location
    Braunschweig, Germany
  • Print_ISBN
    0-7803-3376-4
  • Type

    conf

  • DOI
    10.1109/CPEM.1996.546667
  • Filename
    546667