Title :
Influence of the contact resistance on precision measurements of the quantum Hall effect
Author :
Jeckelmann, B. ; Jeanneret, B.
Author_Institution :
Swiss Fed. Office of Metrol., Wabern, Switzerland
Abstract :
The influence of the contacts on the precision of the quantized Hall resistance is studied in a series of high precision measurements. Deviations of the Hall resistance of up to 0.35 ppm from the expected values are observed if the resistance of one of the voltage contacts is comparable to the Hall resistance.
Keywords :
contact resistance; electric resistance measurement; electrical contacts; measurement standards; quantum Hall effect; contact resistance; precision measurements; quantized Hall resistance; quantum Hall effect; voltage contacts; Contact resistance; Current measurement; Electrical resistance measurement; Electrons; Gallium arsenide; Geometry; Hall effect; Metrology; Probes; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1996 Conference on
Conference_Location :
Braunschweig, Germany
Print_ISBN :
0-7803-3376-4
DOI :
10.1109/CPEM.1996.546667
