DocumentCode
2384463
Title
Combined method for simulating electron spectrum of δ-doped quantum wells in n-Si
Author
Grimalsky, V. ; Gaggero-Sager, L.M. ; Koshevaya, S. ; Castrejon-M, C.
Author_Institution
Fac. of Sci., Autonomous Univ. of State Morelos (UAEM), Cuernavaca, Mexico
fYear
2012
fDate
13-16 May 2012
Firstpage
305
Lastpage
308
Abstract
The combined method to investigate the electron spectrum of single n-type δ-doped quantum wells in silicon is proposed. It is based on computing the electron potential energy by means of the Thomas-Fermi method at finite temperatures; then the obtained potential energy is applied to the iteration procedure with solving the Schrödinger equations for the electron spectrum and the Poisson one for the potential energy. The combined method demonstrates rapid convergence. It is shown that that the simple TF method gives a good approximation for the electron potential energy and for the total electron concentration within the well.
Keywords
Schrodinger equation; approximation theory; elemental semiconductors; iterative methods; semiconductor quantum wells; silicon; Schrödinger equations; TF method; Thomas-Fermi method; approximation; electron potential energy; electron spectrum; finite temperatures; iteration procedure; silicon; simulating electron spectrum; single n-type δ-doped quantum wells; total electron concentration; Doping; Equations; Mathematical model; Potential energy; Semiconductor process modeling; Silicon; Wave functions;
fLanguage
English
Publisher
ieee
Conference_Titel
Microelectronics (MIEL), 2012 28th International Conference on
Conference_Location
Nis
ISSN
pending
Print_ISBN
978-1-4673-0237-1
Type
conf
DOI
10.1109/MIEL.2012.6222861
Filename
6222861
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