• DocumentCode
    2384463
  • Title

    Combined method for simulating electron spectrum of δ-doped quantum wells in n-Si

  • Author

    Grimalsky, V. ; Gaggero-Sager, L.M. ; Koshevaya, S. ; Castrejon-M, C.

  • Author_Institution
    Fac. of Sci., Autonomous Univ. of State Morelos (UAEM), Cuernavaca, Mexico
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    305
  • Lastpage
    308
  • Abstract
    The combined method to investigate the electron spectrum of single n-type δ-doped quantum wells in silicon is proposed. It is based on computing the electron potential energy by means of the Thomas-Fermi method at finite temperatures; then the obtained potential energy is applied to the iteration procedure with solving the Schrödinger equations for the electron spectrum and the Poisson one for the potential energy. The combined method demonstrates rapid convergence. It is shown that that the simple TF method gives a good approximation for the electron potential energy and for the total electron concentration within the well.
  • Keywords
    Schrodinger equation; approximation theory; elemental semiconductors; iterative methods; semiconductor quantum wells; silicon; Schrödinger equations; TF method; Thomas-Fermi method; approximation; electron potential energy; electron spectrum; finite temperatures; iteration procedure; silicon; simulating electron spectrum; single n-type δ-doped quantum wells; total electron concentration; Doping; Equations; Mathematical model; Potential energy; Semiconductor process modeling; Silicon; Wave functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics (MIEL), 2012 28th International Conference on
  • Conference_Location
    Nis
  • ISSN
    pending
  • Print_ISBN
    978-1-4673-0237-1
  • Type

    conf

  • DOI
    10.1109/MIEL.2012.6222861
  • Filename
    6222861