DocumentCode :
23848
Title :
Using diamond layout style to boost MOSFET frequency response of analogue IC
Author :
Gimenez, Salvador Pinillos ; Leoni, R.D. ; Renaux, Christian ; Flandre, Denis
Author_Institution :
Electr. Eng. Dept., FEI Univ. Center, Sao Paulo, Brazil
Volume :
50
Issue :
5
fYear :
2014
fDate :
Feb. 27 2014
Firstpage :
398
Lastpage :
400
Abstract :
A way to improve the metal-oxide-semiconductor field effect transistor (MOSFET) analogue electrical performance, still little explored, is to modify their aspect form or ratio (AR) by the use of innovative layout styles. The diamond MOSFET (DM) is an example of this approach. It presents hexagonal gate geometry. This new layout structure for MOSFET induces two additional effects in comparison with the conventional (i.e. rectangular gate geometry) MOSFET (CM) counterpart, which improves the device´s electrical performance: the longitudinal corner effect (LCE) and parallel association of MOSFET with different channel length effect (PAMDLE). How the diamond layout style (DLS) can significantly enhance the device´s frequency response (FR) by using two different integrated circuits´ (IC) complementary metal-oxide-semiconductor (CMOS) manufacturing process technologies (bulk and silicon-on-insulator (SOI)) is demonstrated.
Keywords :
CMOS analogue integrated circuits; analogue integrated circuits; frequency response; integrated circuit layout; CMOS manufacturing process technologies; MOSFET frequency response; analog IC; analog electrical performance; aspect form; aspect ratio; channel length effect; complementary metal-oxide-semiconductor; diamond MOSFET; diamond layout style; hexagonal gate geometry; integrated circuits; layout structure; longitudinal corner effect; metal-oxide-semiconductor field effect transistor;
fLanguage :
English
Journal_Title :
Electronics Letters
Publisher :
iet
ISSN :
0013-5194
Type :
jour
DOI :
10.1049/el.2013.4038
Filename :
6759675
Link To Document :
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