DocumentCode :
2385157
Title :
Modeling and control of a new actuation mechanism for Interfacial Force Microscopy
Author :
Mesbah-Nejad, A. ; Moallem, M. ; Patel, R.V.
Author_Institution :
Dept. of Electr. & Comput. Eng., Western Ontario Univ., London, ON
fYear :
2008
fDate :
11-13 June 2008
Firstpage :
2052
Lastpage :
2057
Abstract :
In this paper, a new model for a capacitance- based force sensor used in interfacial force microscopy (IFM) is proposed. This model considers both rotation and bending of the torsion bars of a teeter-totter mechanism. A new actuation method is introduced which greatly reduces the stress and strain of the torsion bars. This results in increased sensitivity of the sensor. A dynamic output feedback controller for this actuation scheme is utilized in which the only measurement required is the position of the sensor. Simulation results are presented that confirm the analytical results.
Keywords :
bending; feedback; force sensors; microscopy; physical instrumentation control; rotation; actuation mechanism; bending; capacitance- based force sensor; dynamic output feedback controller; interfacial force microscopy; rotation; teeter-totter mechanism; torsion bars; Analytical models; Bars; Capacitance; Capacitive sensors; Force control; Force sensors; Microscopy; Output feedback; Position measurement; Stress;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
American Control Conference, 2008
Conference_Location :
Seattle, WA
ISSN :
0743-1619
Print_ISBN :
978-1-4244-2078-0
Electronic_ISBN :
0743-1619
Type :
conf
DOI :
10.1109/ACC.2008.4586795
Filename :
4586795
Link To Document :
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