DocumentCode :
2385445
Title :
C-V-testing of electret transducers
Author :
Shchelko, N.S. ; Sokolova, I.M. ; Zakrzhevskiy, V.I.
Author_Institution :
Dept. of Dielectrics & Semicond., Electrotech. Univ., St. Petersburg, Russia
fYear :
1994
fDate :
7-9 Sep 1994
Firstpage :
1028
Lastpage :
1033
Abstract :
A non-destructive method for electret transducers testing is suggested and discussed. The method allows to determine electret-transducers (microphone, telephone, etc.) insert parameters, e.g. electret surface potential air gap width, membrane tension and deflection. The method is based on the insert C-V-characteristic measurements. C-V-testing method can be also used in investigation of electromechanical properties of two roughed surfaces contact, one of the surfaces being dielectric (electret) and allows to optimize the transducer´s geometry and surface potential value
Keywords :
electrets; electric current measurement; nondestructive testing; piezoelectric transducers; surface potential; surface topography; voltage measurement; C-V-testing; deflection; electret surface potential air gap width; electret transducers; electromechanical properties; membrane tension; microphone; roughed surfaces contact; surface potential; telephone; transducer´s geometry; Biomembranes; Dielectric measurements; Electrets; Microphones; Nondestructive testing; Optimization methods; Rough surfaces; Surface roughness; Telephony; Transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 1994. (ISE 8), 8th International Symposium on
Conference_Location :
Paris
Print_ISBN :
0-7803-1940-0
Type :
conf
DOI :
10.1109/ISE.1994.515266
Filename :
515266
Link To Document :
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