DocumentCode
2385584
Title
Control of nano- and micro-crystalline copper electrodeposits
Author
Trzaska, M. ; Trzaska, Z.W.
Author_Institution
Fac. of Mater. Sci. & Eng., Warsaw Univ. of Technol., Warsaw
fYear
2008
fDate
11-13 June 2008
Firstpage
2196
Lastpage
2201
Abstract
In this paper, electrodeposition of nano- and micro-crystalline copper films and thin-layers with direct and pulse periodic currents is effectively controlled. Electrical and physico-chemical characterizations of the copper films are realized, and the optimized electrodeposition parameters are so determined. Next, they are applied to micromolding. The attention is focused on microstructure, surface roughness, hardness, and on process parameters leading to major differences in final products. The obtained results show that the addition of a spike and a decrease in forward current can improve the throwing power in plating quality. Decrease in the grains dimension of the copper layers results in an increase of both the corrosion rate and the double layer capacitance but then charge transfer resistance decreases.
Keywords
charge exchange; copper; corrosion; crystal microstructure; electrodeposition; electrodeposits; hardness; metallic thin films; moulding; nanostructured materials; nanotechnology; surface roughness; Cu; charge transfer resistance; corrosion; double layer capacitance; electrical characterizations; electrodeposition; forward current; grain dimension; hardness; microcrystalline copper films; micromolding; microstructure; nanocrystalline copper films; physico-chemical characterizations; pulse periodic currents; surface roughness; thin-layers; Atomic force microscopy; Computer aided manufacturing; Copper; Corrosion; Electric resistance; Integrated circuit interconnections; Nanostructured materials; Scanning electron microscopy; Semiconductor materials; Transmission electron microscopy;
fLanguage
English
Publisher
ieee
Conference_Titel
American Control Conference, 2008
Conference_Location
Seattle, WA
ISSN
0743-1619
Print_ISBN
978-1-4244-2078-0
Electronic_ISBN
0743-1619
Type
conf
DOI
10.1109/ACC.2008.4586818
Filename
4586818
Link To Document