• DocumentCode
    2385584
  • Title

    Control of nano- and micro-crystalline copper electrodeposits

  • Author

    Trzaska, M. ; Trzaska, Z.W.

  • Author_Institution
    Fac. of Mater. Sci. & Eng., Warsaw Univ. of Technol., Warsaw
  • fYear
    2008
  • fDate
    11-13 June 2008
  • Firstpage
    2196
  • Lastpage
    2201
  • Abstract
    In this paper, electrodeposition of nano- and micro-crystalline copper films and thin-layers with direct and pulse periodic currents is effectively controlled. Electrical and physico-chemical characterizations of the copper films are realized, and the optimized electrodeposition parameters are so determined. Next, they are applied to micromolding. The attention is focused on microstructure, surface roughness, hardness, and on process parameters leading to major differences in final products. The obtained results show that the addition of a spike and a decrease in forward current can improve the throwing power in plating quality. Decrease in the grains dimension of the copper layers results in an increase of both the corrosion rate and the double layer capacitance but then charge transfer resistance decreases.
  • Keywords
    charge exchange; copper; corrosion; crystal microstructure; electrodeposition; electrodeposits; hardness; metallic thin films; moulding; nanostructured materials; nanotechnology; surface roughness; Cu; charge transfer resistance; corrosion; double layer capacitance; electrical characterizations; electrodeposition; forward current; grain dimension; hardness; microcrystalline copper films; micromolding; microstructure; nanocrystalline copper films; physico-chemical characterizations; pulse periodic currents; surface roughness; thin-layers; Atomic force microscopy; Computer aided manufacturing; Copper; Corrosion; Electric resistance; Integrated circuit interconnections; Nanostructured materials; Scanning electron microscopy; Semiconductor materials; Transmission electron microscopy;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference, 2008
  • Conference_Location
    Seattle, WA
  • ISSN
    0743-1619
  • Print_ISBN
    978-1-4244-2078-0
  • Electronic_ISBN
    0743-1619
  • Type

    conf

  • DOI
    10.1109/ACC.2008.4586818
  • Filename
    4586818