• DocumentCode
    2385610
  • Title

    Impact of radiation loss in on-chip transmission-line for terahertz applications

  • Author

    Tsuchiya, Akira ; Onodera, Hidetoshi

  • Author_Institution
    Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
  • fYear
    2012
  • fDate
    13-16 May 2012
  • Firstpage
    125
  • Lastpage
    128
  • Abstract
    This paper discusses radiation loss of on-chip transmission-line. Since terahertz applications of integrated circuits are emerging, precise modeling in terahertz region is needed. We evaluate conductor loss, dielectric loss and radiation loss of on-chip transmission-line by a full-wave field solver. Simulation results show that design focusing conductor loss may cause large radiation loss in terahertz region. Quantitative evaluation of the impact of radiation loss is demonstrated. Also we show that thick signal wire and differential line is effective to reduce the loss.
  • Keywords
    dielectric losses; terahertz wave generation; transmission lines; conductor loss; dielectric loss; full-wave field solver; integrated circuits; on-chip transmission-line; radiation loss; terahertz applications; Aluminum; Copper; Rectangular waveguides; Yarn;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
  • Conference_Location
    Sorrento
  • Print_ISBN
    978-1-4673-1503-6
  • Type

    conf

  • DOI
    10.1109/SaPIW.2012.6222926
  • Filename
    6222926