DocumentCode
2385610
Title
Impact of radiation loss in on-chip transmission-line for terahertz applications
Author
Tsuchiya, Akira ; Onodera, Hidetoshi
Author_Institution
Dept. of Commun. & Comput. Eng., Kyoto Univ., Kyoto, Japan
fYear
2012
fDate
13-16 May 2012
Firstpage
125
Lastpage
128
Abstract
This paper discusses radiation loss of on-chip transmission-line. Since terahertz applications of integrated circuits are emerging, precise modeling in terahertz region is needed. We evaluate conductor loss, dielectric loss and radiation loss of on-chip transmission-line by a full-wave field solver. Simulation results show that design focusing conductor loss may cause large radiation loss in terahertz region. Quantitative evaluation of the impact of radiation loss is demonstrated. Also we show that thick signal wire and differential line is effective to reduce the loss.
Keywords
dielectric losses; terahertz wave generation; transmission lines; conductor loss; dielectric loss; full-wave field solver; integrated circuits; on-chip transmission-line; radiation loss; terahertz applications; Aluminum; Copper; Rectangular waveguides; Yarn;
fLanguage
English
Publisher
ieee
Conference_Titel
Signal and Power Integrity (SPI), 2012 IEEE 16th Workshop on
Conference_Location
Sorrento
Print_ISBN
978-1-4673-1503-6
Type
conf
DOI
10.1109/SaPIW.2012.6222926
Filename
6222926
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