Title :
A new model-based estimation of ellipses for object representation
Author :
Kong, Jun ; Boyer, Kim L. ; Saltz, Joel H. ; Huang, Kun
Author_Institution :
Center for Comprehensive Inf., Emory Univ., Atlanta, GA, USA
Abstract :
Fitting geometric models to objects of interest in images is one of the most classical problems studied in computer vision field. As a result of its strong representation power and flexibility, conic is one of the geometric primitives widely used in a large number of image analysis applications, in practice. As opposed to most existing conic fitting methods minimizing the fitting error with the use of the second order polynomial representation, in this paper, we propose a new method that formulates the geometric fitting problem as a process of seeking for the optimal mapping to a bivariate normal distribution model. As a result, some critical disadvantages tightly coupled with those methods following the routine polynomial representation can be well overcome. To demonstrate this, a set of carefully designed comparison experiments is conducted to show the superiority of the newly proposed method to a representative method using the polynomial representation. Additionally, the practical effectiveness of the proposed method is further manifested using a set of real image data with a promising accuracy.
Keywords :
biomedical optical imaging; computer vision; curve fitting; image representation; medical image processing; normal distribution; polynomials; bivariate normal distribution model; computer vision field; conic fitting method; geometric fitting error; geometric model; image analysis; model-based ellipse estimation; object representation; optical coherent tomography; polynomial representation; Algorithms; Computer Graphics; Data Interpretation, Statistical; Image Processing, Computer-Assisted; Mathematics; Models, Statistical; Models, Theoretical; Regression Analysis; Reproducibility of Results;
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
DOI :
10.1109/IEMBS.2009.5333149