DocumentCode :
2385923
Title :
New developments in the TSD-analysis of electrets
Author :
van Turnhout, J.
Author_Institution :
Dept. of Polymer Mater. & Eng., Delft Univ. of Technol., Netherlands
fYear :
2002
fDate :
2002
Firstpage :
1
Lastpage :
2
Abstract :
Modifications of thermally stimulated discharge (TSD) measurements for electrets have been developed to resolve the spatial distribution of the trapped charges. They invoke the use of thermal or pressure waves in order to deform the charged dielectric locally. It is often illuminating to backup TSD with dielectric relaxation spectroscopy (DRS), since TSD is related to DRS in several ways. So we can often borrow from DRS and TDS (time domain spectroscopy) to advance the analysis of TSD. This allows one to broaden the TSD modelling to other functions than KWW, which only relies on one shape parameter. We can also extent the analysis by invoking special distribution functions taken in part from statistics.
Keywords :
dielectric relaxation; electrets; thermally stimulated currents; KWW function; TSD analysis; dielectric relaxation spectroscopy; electret; pressure wave; statistical distribution function; thermal wave; time domain spectroscopy; Current measurement; Dielectric measurements; Distribution functions; Electrets; Electrochemical impedance spectroscopy; Shape; Spatial resolution; Statistical analysis; Statistical distributions; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
Print_ISBN :
0-7803-7560-2
Type :
conf
DOI :
10.1109/ISE.2002.1042930
Filename :
1042930
Link To Document :
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