• DocumentCode
    2385923
  • Title

    New developments in the TSD-analysis of electrets

  • Author

    van Turnhout, J.

  • Author_Institution
    Dept. of Polymer Mater. & Eng., Delft Univ. of Technol., Netherlands
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Modifications of thermally stimulated discharge (TSD) measurements for electrets have been developed to resolve the spatial distribution of the trapped charges. They invoke the use of thermal or pressure waves in order to deform the charged dielectric locally. It is often illuminating to backup TSD with dielectric relaxation spectroscopy (DRS), since TSD is related to DRS in several ways. So we can often borrow from DRS and TDS (time domain spectroscopy) to advance the analysis of TSD. This allows one to broaden the TSD modelling to other functions than KWW, which only relies on one shape parameter. We can also extent the analysis by invoking special distribution functions taken in part from statistics.
  • Keywords
    dielectric relaxation; electrets; thermally stimulated currents; KWW function; TSD analysis; dielectric relaxation spectroscopy; electret; pressure wave; statistical distribution function; thermal wave; time domain spectroscopy; Current measurement; Dielectric measurements; Distribution functions; Electrets; Electrochemical impedance spectroscopy; Shape; Spatial resolution; Statistical analysis; Statistical distributions; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
  • Print_ISBN
    0-7803-7560-2
  • Type

    conf

  • DOI
    10.1109/ISE.2002.1042930
  • Filename
    1042930