DocumentCode
2385939
Title
Models of charge transport in electron-beam irradiated insulators
Author
Sessler, G.M. ; Figueiredo, M.T. ; Ferreira, G.F.Leal
Author_Institution
Darmstadt Univ. of Technol., Germany
fYear
2002
fDate
2002
Firstpage
3
Lastpage
6
Abstract
Carrier generation in an insulator due to electron-beam irradiation causes a radiation-induced conductivity. This phenomenon can be considered in the equations for charge transport in two different ways: A first, macroscopic, approach takes into account only the radiation-induced conductivity while a second, microscopic, scheme is based on a detailed description of the carrier generation and recombination in the insulator including the carrier mobility. As compared to the macroscopic approach, the microscopic procedure requires a larger and more complicated system of equations and the knowledge of the generation and recombination rates. Therefore, numerical evaluations on the basis of the macroscopic model are often more desirable. In this case, only the knowledge of the radiation-induced conductivity, which is easily measurable, is necessary. Numerical results for open-circuit conditions, obtained from both models, are compared and advantages and drawbacks of the two models discussed.
Keywords
carrier mobility; electrical conductivity; electron beam effects; electron-hole recombination; insulating materials; modelling; GR model; RIC model; carrier generation; carrier mobility; carrier recombination; charge transport equations; charge transport models; electron-beam irradiated insulators; macroscopic model; numerical evaluations; open-circuit conditions; radiation-induced conductivity; Conductivity measurement; Dielectrics; Differential equations; Electron beams; Electron traps; Insulation; Microscopy; Solid modeling; Spontaneous emission; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
Print_ISBN
0-7803-7560-2
Type
conf
DOI
10.1109/ISE.2002.1042931
Filename
1042931
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