Title :
Detection and location for single faults in bitonic sorters
Author :
Lee, Tsern-Huei ; Chou, Jin-Jye
Author_Institution :
Dept. of Commun. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
Bitonic sorters have previously been adopted to construct along with banyan networks the switching fabrics of future broadband networks. Unfortunately, a single fault in the bitonic sorter may become a disaster to the switching system. Therefore, a bitonic sorter must be proved to be free of faults before it can be used. The authors present an efficient fault diagnosis procedure to detect and locate single faults in bitonic sorters without state control lines. The diagnosis procedure can detect most single faults in two tests. The faults which cannot be detected in two tests can always be detected in four tests. Several binary search techniques are developed to locate a faulty sorting element (i.e. 2×2 sorter.)
Keywords :
broadband networks; fault diagnosis; search problems; switching networks; banyan networks; binary search techniques; bitonic sorters; broadband networks; diagnosis procedure; fault diagnosis procedure; faulty sorting element; single faults; switching fabrics; switching system; Broadband communication; Circuit faults; Communication switching; Fabrics; Fault detection; Fault diagnosis; Integrated circuit modeling; Intelligent networks; Sorting; Testing;
Conference_Titel :
Communications, 1994. ICC '94, SUPERCOMM/ICC '94, Conference Record, 'Serving Humanity Through Communications.' IEEE International Conference on
Conference_Location :
New Orleans, LA
Print_ISBN :
0-7803-1825-0
DOI :
10.1109/ICC.1994.368867