DocumentCode :
2386222
Title :
TSDC measurements of underfill encapsulant used in microelectronic packaging
Author :
Cheng, K.C. ; Peng, Z. ; Wong, C.S. ; Chan, H.L.W.
Author_Institution :
Dept. of Appl. Phys., Hong Kong Polytech. Univ., China
fYear :
2002
fDate :
2002
Firstpage :
71
Lastpage :
74
Abstract :
The thermal stimulated depolarization current (TSDC) technique was used to study the dielectric relaxation of underfill encapsulant used in microelectronic packaging. The dependence of electrical properties of the underfill on the polarizing temperature, polarizing field and heating rate were analyzed from the TSDC spectra as a function of temperature. A single α-relaxation peak associated with the glass transition temperature Tg of the underfill was observed. A value of Tg can be estimated which can be compared to the Tg determined by differential scanning calorimetry (DSC). The activation energy and relaxation time of the dielectric relaxation of the underfill were determined from the TSDC measurements.
Keywords :
dielectric relaxation; differential scanning calorimetry; encapsulation; glass transition; integrated circuit packaging; polymers; thermally stimulated currents; 90 C; DSC; TSDC measurements; TSDC spectra; TSDC technique; activation energy; dielectric relaxation; differential scanning calorimetry; electrical properties; glass transition temperature; heating rate; microelectronic packaging; polarizing field; polarizing temperature; relaxation time; thermal stimulated depolarization current; underfill encapsulant; underfill epoxy; Calorimetry; Dielectric measurements; Energy measurement; Glass; Microelectronics; Packaging; Polarization; Resistance heating; Temperature dependence; Time measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
Print_ISBN :
0-7803-7560-2
Type :
conf
DOI :
10.1109/ISE.2002.1042946
Filename :
1042946
Link To Document :
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