• DocumentCode
    2386246
  • Title

    Dielectric properties of polymers with fractal architecture

  • Author

    Dantras, E. ; Caminade, A.M. ; Majoral, J.P. ; Lacabanne, C.

  • Author_Institution
    Lab. de Phys. des Polymeres, Univ. Paul Sabatier, Toulouse, France
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    75
  • Lastpage
    78
  • Abstract
    A set of phosphorus-containing dendrimers involving three generations (g = 0, 1 and 2) has been investigated using dynamic dielectric spectroscopy and thermostimulated currents techniques. The dendrimers show a low temperature β mode with an Arrhenius type temperature dependence. Havriliak-Negami parameters of this mode are strongly influenced by the generation. For g = 0 dendrimer, a narrow TSC relaxation mode, with a quasi-Debye behavior has been also found. It has been associated with dipolar relaxation of aldehyde groups. This mode is observed in g = 1 and g = 2 dendrimers, with a mild modification of its characteristics due to interactions with phosphorus/sulfur strong dipoles (P = S groups). An additional metastable mode has been experimentally isolated. It might be due to structural relaxation.
  • Keywords
    dielectric polarisation; dielectric relaxation; fractals; glass transition; phosphorus; polymers; thermally stimulated currents; Arrhenius type temperature dependence; Havriliak-Negami parameters; TSC relaxation mode; aldehyde groups; dielectric properties; dipolar relaxation; dynamic dielectric spectroscopy; fractal architecture; glass transition associated mode; low temperature mode; phosphorus-containing dendrimers; polymers; quasi-Debye behavior; structural relaxation; thermostimulated currents technique; Dielectric measurements; Electrochemical impedance spectroscopy; Fractals; Frequency; Permittivity measurement; Polarization; Polymers; Powders; Temperature dependence; Temperature distribution;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
  • Print_ISBN
    0-7803-7560-2
  • Type

    conf

  • DOI
    10.1109/ISE.2002.1042947
  • Filename
    1042947