DocumentCode
2386266
Title
Productivity improvement for dry etch equipment through the application of simulation
Author
Pampel, Sandro ; Domaschke, Jörg ; Jetter, Harald
Author_Institution
Infineon Technol. Dresden, Germany
fYear
2000
fDate
2000
Firstpage
79
Lastpage
83
Abstract
The standards of the semiconductor market with its specifications are leading to a basic demand for an increase in productivity. On a department level, this can be achieved through an increase in equipment throughput and/or in an increase in wafer starts at constant and/or less clean-room area used by the process group. Through simulation of Clustertools in various operation modes, possibilities were found to improve the operation of this equipment. In addition, Infineon Dresden was able to examine different hardware configurations in the dry etch sector. In concrete examples, discrete event simulation results of Clustertools showed possibilities for throughput increases and performance improvements of up to 20%, thus supporting the decisions for capacity developments and hardware alterations. The comparison with data from on-tool tests verified the simulation software and its results. Important general findings on the behaviour of Clustertools will be introduced
Keywords
etching; integrated circuit manufacture; process control; production engineering computing; Clustertools; dry etch equipment; performance improvement; productivity improvement; semiconductor market; simulation software; throughput increase; Analytical models; Concrete; Cost benefit analysis; Dry etching; Hardware; Production; Productivity; Software tools; Testing; Throughput;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on
Conference_Location
Tokyo
ISSN
1523-553X
Print_ISBN
0-7803-7392-8
Type
conf
DOI
10.1109/ISSM.2000.993621
Filename
993621
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