Title :
A Seamless Ultra-Thin Chip Fabrication and Assembly Process
Author :
Zimmermann, Martin ; Burghartz, Joachim N. ; Appel, Wolfgang ; Remmers, Nils ; Burwick, Christian ; Wurz, Roland ; Tobail, Osama ; Schubert, Markus ; Palfinger, Gunther ; Werner, Jurgen
Author_Institution :
Burwick Inst. for Microelectron., Stuttgart
Abstract :
Various new applications of silicon technology, such as 3D circuit integration (Patti, 2006), system-on-chip (SoC), system-in-package (SiP), and electronics on foil or textile (Sanda et al.,2005), call for low-cost manufacturing and assembly of ultra-thin chips (5-50 mum). Practically all currently pursued concepts for fabricating thin chips are based on post-process thinning at wafer level, which, at thickness <50 mum, require application of a costly handle substrate. Also, grinding techniques applied to very thin wafers may lead to defect formation, thickness non-uniformity (wedging), and wafer fracture, thus causing yield loss and leading to high cost at this late stage of manufacture (Feil et al., 204). The paper proposed a new concept based on thin-chip fabrication by wafer pre-processing prior to the CMOS integration instead of post-process thinning of the entire wafer. There, the conventional chip dicing is replaced by a novel Pick, Crack & Placetrade process, through which the thin chip fabrication and assembly processes are seamlessly connected
Keywords :
microassembling; semiconductor technology; 5 to 50 micron; Pick Crack & Placetrade process; assembly process; low-cost manufacturing; thin-chip fabrication; ultra-thin chip assembly; ultra-thin chip fabrication; wafer pre-processing; Annealing; Assembly; CMOS process; Chip scale packaging; Circuit testing; Fabrication; Manufacturing processes; Semiconductor films; Silicon; Substrates;
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0439-8
Electronic_ISBN :
1-4244-0439-8
DOI :
10.1109/IEDM.2006.346787