DocumentCode

2386451

Title

Modeling and Simulation - Simulation of Process and Advanced Memories

fYear

2006

fDate

11-13 Dec. 2006

Firstpage

1

Lastpage

1

Keywords

Flash memory; National electric code; Random access memory; SONOS devices; Semiconductor process modeling; Simulated annealing; Turning;

fLanguage

English

Publisher

ieee

Conference_Titel

Electron Devices Meeting, 2006. IEDM '06. International

Conference_Location

San Francisco, CA

Print_ISBN

1-4244-0438-X

Type

conf

DOI

10.1109/IEDM.2006.346788

Filename

4154207