Title :
Modeling and Simulation - Simulation of Process and Advanced Memories
Keywords :
Flash memory; National electric code; Random access memory; SONOS devices; Semiconductor process modeling; Simulated annealing; Turning;
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0438-X
DOI :
10.1109/IEDM.2006.346788
