DocumentCode
2386635
Title
Quantum, Power, and Compound Semiconductor Devices - GaN Technology, Processes, Reliability and Circuit Applications
fYear
2006
fDate
11-13 Dec. 2006
Firstpage
1
Lastpage
1
Keywords
Circuits; Electron traps; Gallium nitride; HEMTs; MMICs; MODFETs; Paper technology; Pulse amplifiers; Semiconductor device reliability; Semiconductor devices;
fLanguage
English
Publisher
ieee
Conference_Titel
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location
San Francisco, CA
Print_ISBN
1-4244-0438-X
Type
conf
DOI
10.1109/IEDM.2006.346796
Filename
4154215
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