A Fast and Accurate Monte Carlo Method for Interconnect Variation

Author

Zhang, M. ; Olbrich, Markus ; Kinzelbach, H. ; Seider, D. ; Barke, Erich

Author_Institution

Inst. of Microelectron. Syst., Hannover Univ.

fYear

0

fDate

0-0 0

Firstpage

1

Lastpage

4

Abstract

For exploring the impact of manufacturing variation on interconnect characteristics, the basic Monte Carlo Method is accurate but computationally very expensive. To overcome the inherent speed limitation we developed an uncomplicated method employing the importance sampling technique. Using confidence intervals our results always take uncertainty into account. The application to a two dimensional interconnect model shows that our method is 23~93 times faster than the basic Monte Carlo method

Keywords

design for manufacture; importance sampling; integrated circuit interconnections; integrated circuit reliability; 2D interconnect model; Monte Carlo method; confidence intervals; importance sampling technique; interconnect characteristics; interconnect variation; Computer aided manufacturing; Integrated circuit interconnections; Microelectronics; Monte Carlo methods; Optical wavelength conversion; Power system interconnection; Power system modeling; Power system reliability; Solid modeling; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Integrated Circuit Design and Technology, 2006. ICICDT '06. 2006 IEEE International Conference on

Conference_Location

Padova

Print_ISBN

1-4244-0097-X

Type

conf

DOI

10.1109/ICICDT.2006.220828

Filename

1669415