• DocumentCode
    2387195
  • Title

    Electrical properties of organic thin films and surface analyses of ITO substrate for organic EL device

  • Author

    Fujita, S. ; Tanaka, K.

  • Author_Institution
    Dept. of Electr. & Electron. Eng., Hachinohe Inst. of Technol., Japan
  • fYear
    2002
  • fDate
    2002
  • Firstpage
    271
  • Lastpage
    274
  • Abstract
    Organic electroluminescent devices are looked forward to as devices for next generation flat panel displays to replace liquid crystal and environmentally friendly light sources, and aggressive research and development on them is being conducted. As the organic electroluminescent devices have a multilayer structure depositing organic layers on ITO electrodes, it is surmised that the shape of the surface of the electrode has influences on electrical characteristics and emission characteristics of the device. In this research, in addition to observation of the shape of surface by AFM images of ITO electrodes deposited by vacuum deposition and sputtering and measurement of the state of element distribution and crystal structure, EL devices were prepared and measurement of electrical characteristics was conducted.
  • Keywords
    atomic force microscopy; electroluminescent devices; indium compounds; organic compounds; sputtered coatings; substrates; thin film devices; tin compounds; vacuum deposited coatings; AFM imaging; ITO; ITO substrate; InSnO; crystal structure; electrical properties; electrode surface analysis; element distribution; environmentally friendly light source; flat panel display; multilayer structure; organic electroluminescent device; organic thin film; sputter deposition; vacuum deposition; Electric variables; Electric variables measurement; Electrodes; Electroluminescent devices; Flat panel displays; Indium tin oxide; Liquid crystal devices; Liquid crystal displays; Shape measurement; Thin film devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets, 2002. ISE 11. Proceedings. 11th International Symposium on
  • Print_ISBN
    0-7803-7560-2
  • Type

    conf

  • DOI
    10.1109/ISE.2002.1042995
  • Filename
    1042995