• DocumentCode
    2387302
  • Title

    Electrocoagulation as a viable technique to treat (Cu-)CMP wastes

  • Author

    Van Hoeymissen, Jan A B ; Van den Broeck, K. ; Van Hoornick, N. ; Heyns, M.

  • Author_Institution
    IMEC, Leuven, Belgium
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    313
  • Lastpage
    316
  • Abstract
    CMP has become a major process technology. As a result, high volumetric CMP waste streams containing suspended slurry particles and residues, polished from the wafer surface, are generated. This imposes severe demands on the treatment of these effluent streams, since the presence of the high TSS-content and metals like Cu and W is considered as environmental hazardous. In the present study it is demonstrated that the simple technique of electrocoagulation (EC) is a viable alternative to treat (Cu-)CMP wastes. A wide range of silica and alumina-based slurries (and mixtures thereof) have been tested in a lab-scale setup. Electrocoagulation has been found to destabilize in a relatively short time these suspensions. As a result, a transparent supernatant is formed, besides a compact, low volume sludge residual, which can be readily removed by simple, classical filtration. Moreover, the Cu and W present in the waste are removed from the liquid phase with efficiencies >99%, resulting in final metal concentrations below 100 ppb, thus well below water discharge limits. Experiments were done with both simulated and real wastes, which exhibited basically the same behavior
  • Keywords
    chemical mechanical polishing; coagulation; filtration; waste disposal; CMP waste; Cu; chemical mechanical polishing; effluent streams; electrocoagulation; filtration; low volume sludge residual; suspended slurry particles; transparent supernatant; Aluminum; Copper; Effluents; Electrodes; Filtration; Silicon compounds; Slurries; Surface treatment; Suspensions; Wastewater treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on
  • Conference_Location
    Tokyo
  • ISSN
    1523-553X
  • Print_ISBN
    0-7803-7392-8
  • Type

    conf

  • DOI
    10.1109/ISSM.2000.993676
  • Filename
    993676