DocumentCode
2387302
Title
Electrocoagulation as a viable technique to treat (Cu-)CMP wastes
Author
Van Hoeymissen, Jan A B ; Van den Broeck, K. ; Van Hoornick, N. ; Heyns, M.
Author_Institution
IMEC, Leuven, Belgium
fYear
2000
fDate
2000
Firstpage
313
Lastpage
316
Abstract
CMP has become a major process technology. As a result, high volumetric CMP waste streams containing suspended slurry particles and residues, polished from the wafer surface, are generated. This imposes severe demands on the treatment of these effluent streams, since the presence of the high TSS-content and metals like Cu and W is considered as environmental hazardous. In the present study it is demonstrated that the simple technique of electrocoagulation (EC) is a viable alternative to treat (Cu-)CMP wastes. A wide range of silica and alumina-based slurries (and mixtures thereof) have been tested in a lab-scale setup. Electrocoagulation has been found to destabilize in a relatively short time these suspensions. As a result, a transparent supernatant is formed, besides a compact, low volume sludge residual, which can be readily removed by simple, classical filtration. Moreover, the Cu and W present in the waste are removed from the liquid phase with efficiencies >99%, resulting in final metal concentrations below 100 ppb, thus well below water discharge limits. Experiments were done with both simulated and real wastes, which exhibited basically the same behavior
Keywords
chemical mechanical polishing; coagulation; filtration; waste disposal; CMP waste; Cu; chemical mechanical polishing; effluent streams; electrocoagulation; filtration; low volume sludge residual; suspended slurry particles; transparent supernatant; Aluminum; Copper; Effluents; Electrodes; Filtration; Silicon compounds; Slurries; Surface treatment; Suspensions; Wastewater treatment;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Manufacturing, 2000. Proceedings of ISSM 2000. The Ninth International Symposium on
Conference_Location
Tokyo
ISSN
1523-553X
Print_ISBN
0-7803-7392-8
Type
conf
DOI
10.1109/ISSM.2000.993676
Filename
993676
Link To Document