DocumentCode :
2387479
Title :
In vivo testing of a low noise 32-channel wireless neural recording system
Author :
Yin, Ming ; Lee, Seung Bae ; Ghovanloo, Maysam
Author_Institution :
Dept. of Electr. & Comput. Eng., NCSU, Raleigh, NC, USA
fYear :
2009
fDate :
3-6 Sept. 2009
Firstpage :
1608
Lastpage :
1611
Abstract :
We present a 32-channel wireless implantable neural recording system-on-a-chip (SoC) that operates based on time division multiplexing (TDM) of pulse width modulated (PWM) samples with minimal substrate noise and interference. We have utilized analog-to-time conversion (ATC) on the transmitter and time-to-digital conversion (TDC) on the receiver to reduce the size and power consumption of the implantable unit by moving the digitization circuitry to the external unit. We have managed the TDM switching times such that no switching occurs during sensitive sampling onsets. The chip has been implemented in the AMI 0.5-mum standard CMOS process, occupying 3.3 times 3.0 mm2 and consuming 5.6 mW at plusmn1.5 V when all channels are active. The measured input referred noise for the entire system, including the receiver at 1 m distance, is only 4.9 muVrms from 1 Hz~10 kHz. Finally, in vivo testing results on rats have been presented to validate the full functionality of the system.
Keywords :
CMOS integrated circuits; analogue-digital conversion; bioelectric phenomena; neurophysiology; prosthetics; time division multiplexing; CMOS; TDM switching; analog-to-time conversion; in vivo testing; low noise 32-channel wireless neural recording system; pulse width modulated; system-on-a-chip; time division multiplexing; time-to-digital conversion; Animals; Noise; Radio Waves; Rats;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2009. EMBC 2009. Annual International Conference of the IEEE
Conference_Location :
Minneapolis, MN
ISSN :
1557-170X
Print_ISBN :
978-1-4244-3296-7
Electronic_ISBN :
1557-170X
Type :
conf
DOI :
10.1109/IEMBS.2009.5333227
Filename :
5333227
Link To Document :
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