DocumentCode :
2388188
Title :
Single Evaluation of C. Elegans inside Environmental Scanning Electron Microscope
Author :
Nakajima, Masahiro ; Ahmad, Mohd Ridzuan ; Kojima, S. ; Homma, Michio ; Fukuda, Toshio
Author_Institution :
Dept. of Micro-Nano Syst. Eng., Nagoya Univ., Nagoya
fYear :
2008
fDate :
6-9 Nov. 2008
Firstpage :
83
Lastpage :
88
Abstract :
This paper presents the single evaluation of Caenorhabditis Elegans (C. Elegans) by the nanorobotic manipulation system inside an Environmental-Scanning Electron Microscope (E-SEM). C. Elegans has complex outer and inner structures constructed by approximately one thousand cells. Their fine structures were observed by E-SEM directly; without any drying or dyeing processes. For example, the lateral alae are the surface mark of seam cell body. The observation environments are controlled under different E-SEM chamber pressures for clear observation of C. Elegans. The local stiffness evaluation method of C. Elegans was proposed by buckling nanoprobe. The Silicon nanoprobe was fabricated by Focus Ion Beam (FIB) etching at the tip of Atomic Force Microscope (AFM) cantilever. The measurement position can arbitrarily be controlled by the nanorobotic manipulator inside the E-SEM. The local stiffness on or around the lateral alae evaluated from the experimental results. This local stiffness measurement technique can readily be applied to reveal unknown biological local stiffness, cell health conditions and novel cell diagnosis.
Keywords :
atomic force microscopy; biocontrol; biological techniques; cantilevers; cellular biophysics; manipulators; position control; scanning electron microscopy; C. Elegans; atomic force microscope cantilever; biological local stiffness; buckling nanoprobe; cell diagnosis; cell health; environmental scanning electron microscope; focus ion beam; nanorobotic manipulator; single evaluation; Atomic beams; Atomic force microscopy; Cells (biology); Electron microscopy; Etching; Ion beams; Nanobioscience; Pressure control; Scanning electron microscopy; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro-NanoMechatronics and Human Science, 2008. MHS 2008. International Symposium on
Conference_Location :
Nagoya
Print_ISBN :
978-1-4244-2918-9
Electronic_ISBN :
978-1-4244-2919-6
Type :
conf
DOI :
10.1109/MHS.2008.4752427
Filename :
4752427
Link To Document :
بازگشت