DocumentCode :
2388762
Title :
Edge location to sub-pixel value in color microscopic images
Author :
Chong Liu ; Zeyi Xia ; Niyokindi, S. ; Wei Pei ; Jincai Song ; Liding Wang
fYear :
2004
fDate :
26-31 Aug. 2004
Firstpage :
548
Lastpage :
551
Abstract :
The great development in micromanipulation technology has exigent request to develop image processing for microscopic images. Considering the characteristics of color microscopic images in micromanipulation imriging system and color information of color microscopic ima;ges, two wavelet transformation based methods in HSI color space and vector space for edge detection were proposed. Then, the interested area of the image is interpolated using cubic spline :and accurate subpixel edges are obtained based on the zero point of first-order derivatives. The methods are applied to images with simulated noise and real images. The experiment results show that the methods are effective for color microscopic images with various magnifications. It is manifested that the experiment results of the two methods are very similar. The experiment results are given at the end of this paper.
Keywords :
Colored noise; Detectors; Image edge detection; Image processing; Laboratories; Microscopy; Pixel; Space technology; Spline; Wavelet transforms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Intelligent Mechatronics and Automation, 2004. Proceedings. 2004 International Conference on
Conference_Location :
Chengdu, China
Print_ISBN :
0-7803-8748-1
Type :
conf
DOI :
10.1109/ICIMA.2004.1384255
Filename :
1384255
Link To Document :
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