• DocumentCode
    2389441
  • Title

    A Comprehensive Study of Carbon Nanotube Based Transistors: The Effects of Geometrical, Interface Barrier, and Scattering Parameters

  • Author

    Pourfath, M. ; Kosina, H. ; Selberherr, S.

  • Author_Institution
    TU, Wien
  • fYear
    2006
  • fDate
    11-13 Dec. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    The performance of carbon nanotube field-effect transistors has been studied based on the non-equilibrium Green´s function formalism. The effects of elastic and inelastic scattering and the impact of parameters, such as electron-phonon coupling strength and phonon energy, on the device performance are analyzed. The effect of scaling of the source-gate spacer, drain-gate spacer, and gate length is studied. The results for devices with different barrier heights at the metal-CNT interface are discussed
  • Keywords
    Green´s function methods; S-parameters; carbon nanotubes; field effect transistors; carbon nanotube field-effect transistors; drain-gate spacer; elastic scattering; electron-phonon coupling strength; gate length; inelastic scattering; interface barrier; metal-CNT interface; nonequilibrium Green function formalism; phonon energy; scattering parameters; source-gate spacer; CNTFETs; Carbon nanotubes; Charge carrier processes; Electrons; Equations; Green´s function methods; Hafnium oxide; MOSFETs; Phonons; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2006. IEDM '06. International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-0438-X
  • Electronic_ISBN
    1-4244-0439-8
  • Type

    conf

  • DOI
    10.1109/IEDM.2006.346739
  • Filename
    4154340