Title :
Characterization of electrical transverse conductivity of space dielectric materials
Author :
Hanna, R. ; Paulmier, T. ; Belha, M. ; Molinié, P. ; Dirassen, B. ; Payan, D. ; Balcon, N.
Abstract :
The effect of ionizing radiation processes and electron penetration depth on the dielectric properties of a 127μm Teflon FEP sample was investigated by surface potential measurements. We have been able to reveal the presence of a transverse conductivity that is enhanced by radiation ionisation process. The irradiation tests performed as a function of the irradiation energy revealed a strong influence of the electron penetration depth on the intrinsic transverse conductivity: this feature might be assigned to the evolution of traps density with the penetration depth.
Keywords :
dielectric materials; electrical conductivity; electron beam effects; polymers; surface charging; carrier generation; charge carriers; electrical transverse conductivity; electron beam irradiation; electron penetration depth; ionizing radiation processes; physical mechanisms steering charge transport; polymer materials; space dielectric materials; surface charge transport; surface effects; Charge carrier processes; Nonhomogeneous media; Radiation effects;
Conference_Titel :
Electrets (ISE), 2011 14th International Symposium on
Conference_Location :
Montpellier
Print_ISBN :
978-1-4577-1023-0
DOI :
10.1109/ISE.2011.6084962
