DocumentCode :
2389651
Title :
Behind space charge distribution measurements
Author :
Hole, S.
Author_Institution :
Lab. de Phys. et d´´Etude des Mater., UPMC, Paris, France
fYear :
2011
fDate :
28-31 Aug. 2011
Firstpage :
35
Lastpage :
36
Abstract :
Measuring space charge seems relatively simple, but the complexity of the sample structure and interfacial conditions may result in biased analysis. In this abstract, some clues are given to test which factor are important to check before analyzing measurements.
Keywords :
charge measurement; space charge; interfacial conditions; space charge distribution measurements; Materials;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets (ISE), 2011 14th International Symposium on
Conference_Location :
Montpellier
ISSN :
2153-3253
Print_ISBN :
978-1-4577-1023-0
Type :
conf
DOI :
10.1109/ISE.2011.6084969
Filename :
6084969
Link To Document :
بازگشت