DocumentCode :
2389757
Title :
Comparison of positively and negatively charged layered inorganic electrets for high operational temperatures
Author :
Leonov, Vladimir ; Goedbloed, M. ; van Schaijk, R. ; Van Hoof, C.
Author_Institution :
Imec, Leuven, Belgium
fYear :
2011
fDate :
28-31 Aug. 2011
Firstpage :
43
Lastpage :
44
Abstract :
Studied positive electrets (except types 4 and 6) are extremely stable at 200-250°C with an estimated lifetime of over 10 years at 200°C. Such stability satisfies the market needs and covers most of emerging applications like vibration energy harvesters. Even at a temperature of 450°C, the 1/e lifetime of charge exceeds 200 hours. Therefore, the electret layers sustain all CMOS-compatible high-temperature technological processes. The electrets and electret-based devices will also be able to survive occasional overheating in applications, because electronic components and devices can already be made functional up to a few hundred degrees Celsius. Negative electrets show lower potential at 450°C, but virtually the same charge lifetime (on an infinitely large sample). However, they rapidly discharge through the edge of a 2-cm sample, and obviously they are not appropriate for high-temperature applications.
Keywords :
CMOS integrated circuits; electrets; high-temperature electronics; CMOS-compatible high-temperature technological process; electret layers; electret-based devices; high operational temperatures; negative charged layered inorganic electrets; positive charged layered inorganic electrets; temperature 200 degC to 250 degC; temperature 450 degC; vibration energy harvesters;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrets (ISE), 2011 14th International Symposium on
Conference_Location :
Montpellier
ISSN :
2153-3253
Print_ISBN :
978-1-4577-1023-0
Type :
conf
DOI :
10.1109/ISE.2011.6084973
Filename :
6084973
Link To Document :
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