• DocumentCode
    2389757
  • Title

    Comparison of positively and negatively charged layered inorganic electrets for high operational temperatures

  • Author

    Leonov, Vladimir ; Goedbloed, M. ; van Schaijk, R. ; Van Hoof, C.

  • Author_Institution
    Imec, Leuven, Belgium
  • fYear
    2011
  • fDate
    28-31 Aug. 2011
  • Firstpage
    43
  • Lastpage
    44
  • Abstract
    Studied positive electrets (except types 4 and 6) are extremely stable at 200-250°C with an estimated lifetime of over 10 years at 200°C. Such stability satisfies the market needs and covers most of emerging applications like vibration energy harvesters. Even at a temperature of 450°C, the 1/e lifetime of charge exceeds 200 hours. Therefore, the electret layers sustain all CMOS-compatible high-temperature technological processes. The electrets and electret-based devices will also be able to survive occasional overheating in applications, because electronic components and devices can already be made functional up to a few hundred degrees Celsius. Negative electrets show lower potential at 450°C, but virtually the same charge lifetime (on an infinitely large sample). However, they rapidly discharge through the edge of a 2-cm sample, and obviously they are not appropriate for high-temperature applications.
  • Keywords
    CMOS integrated circuits; electrets; high-temperature electronics; CMOS-compatible high-temperature technological process; electret layers; electret-based devices; high operational temperatures; negative charged layered inorganic electrets; positive charged layered inorganic electrets; temperature 200 degC to 250 degC; temperature 450 degC; vibration energy harvesters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrets (ISE), 2011 14th International Symposium on
  • Conference_Location
    Montpellier
  • ISSN
    2153-3253
  • Print_ISBN
    978-1-4577-1023-0
  • Type

    conf

  • DOI
    10.1109/ISE.2011.6084973
  • Filename
    6084973