Abstract :
It is my great pleasure and honor to welcome you to the 2010 IEEE International Conference on RFID (IEEE RFID 2010), the fourth annual IEEE RFID conference. IEEE RFID yearly attracts researchers, scientists, engineers, and users who are eager to understand the latest developments in RFID technologies and their related disciplines. Mirroring the diversity in its accepted papers, IEEE RFID brings together a broad variety of outstanding individuals, such as you, from the broad spectrum of RFID technologies. Your participation makes IEEE RFID the place for technical interchanges and innovative brainstorming.
