• DocumentCode
    2389853
  • Title

    CMOS Devices - Silicon-on-Insulator and Multi-Gate Devices

  • fYear
    2006
  • fDate
    11-13 Dec. 2006
  • Firstpage
    1
  • Lastpage
    1
  • Keywords
    Capacitive sensors; FinFETs; Insulation; Leakage current; MOSFETs; Propagation delay; Random access memory; Ring oscillators; Silicon on insulator technology; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electron Devices Meeting, 2006. IEDM '06. International
  • Conference_Location
    San Francisco, CA
  • Print_ISBN
    1-4244-0438-X
  • Type

    conf

  • DOI
    10.1109/IEDM.2006.346921
  • Filename
    4154356
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2389853