DocumentCode :
2390009
Title :
High-Performance FinFET with Dopant-Segregated Schottky Source/Drain
Author :
Kaneko, A. ; Yagishita, A. ; Yahashi, K. ; Kubota, T. ; Omura, M. ; Matsuo, K. ; Mizushima, I. ; Okano, K. ; Kawasaki, H. ; Izumida, T. ; Kanemura, T. ; Aoki, N. ; Kinoshita, A. ; Koga, J. ; Inaba, S. ; Ishimaru, K. ; Toyoshima, Y. ; Ishiuchi, H. ; Suguro
Author_Institution :
Process & Manuf. Eng. Center, Toshiba Corp. Semicond. Co., Yokohama
fYear :
2006
fDate :
11-13 Dec. 2006
Firstpage :
1
Lastpage :
4
Abstract :
High-performance CMOS-FinFET with dopant-segregated Schottky source/drain (DS-Schottky S/D) technology has been demonstrated. Thanks to the low parasitic resistance in DS-Schottky S/D, high drive current of 960 muA/mum was achieved for nFET with Lg = 15 nm and Wfin =15 nm at Vd= 1.0 V and Ioff= 100 nA/mum. Furthermore, the propagation delay time has been successfully improved down to less than 5 ps in the ring oscillator with DS-Schottky S/D CMOS-FinFET with 15 nm gate length
Keywords :
MOSFET; semiconductor doping; 1 V; 15 nm; dopant-segregated Schottky source/drain; high-performance FinFET; improved propagation delay time; ring oscillator; CMOS technology; Circuits; FETs; Fabrication; FinFETs; Ion implantation; Large scale integration; Research and development; Ring oscillators; Toy manufacturing industry;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electron Devices Meeting, 2006. IEDM '06. International
Conference_Location :
San Francisco, CA
Print_ISBN :
1-4244-0438-X
Electronic_ISBN :
1-4244-0439-8
Type :
conf
DOI :
10.1109/IEDM.2006.346926
Filename :
4154361
Link To Document :
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