DocumentCode :
2390045
Title :
Open ended microwave oven for packaging
Author :
Sinclair, K.I. ; Tilford, T. ; Desmulliez, M. ; Goussetis, George ; Bailey, C. ; Parrott, K. ; Sangster, A.J.
Author_Institution :
Microsyst. Eng. Centre, Heriot Watt Univ., Edinburgh
fYear :
2008
fDate :
9-11 April 2008
Firstpage :
16
Lastpage :
20
Abstract :
A novel open waveguide cavity resonator is presented for the combined variable frequency microwave curing of bumps, underfills and encapsulants, as well as the alignment of devices for fast flip-chip assembly, direct chip attach (DCA) or wafer-scale level packaging (WSLP). This technology achieves radio frequency (RF) curing of adhesives used in microelectronics, optoelectronics and medical devices with potential simultaneous micron-scale alignment accuracy and bonding of devices. In principle, the open oven cavity can be fitted directly onto a flip-chip or wafer scale bonder and, as such, will allow for the bonding of devices through localised heating thus reducing the risk to thermally sensitive devices. Variable frequency microwave (VFM) heating and curing of an idealised polymer load is numerically simulated using a multi-physics approach. Electro-magnetic fields within a novel open ended microwave oven developed for use in micro-electronics manufacturing applications are solved using a dedicated Yee scheme finite-difference time-domain (FDTD) solver. Temperature distribution, degree of cure and thermal stresses are analysed using an Unstructured Finite Volume method (UFVM) multi-physics package. The polymer load was meshed for thermophysical analysis, whilst the microwave cavity - encompassing the polymer load - was meshed for microwave irradiation. The two solution domains are linked using a cross mapping routine. The principle of heating using the evanescent fringing fields within the open-end of the cavity is demonstrated. A closed loop feedback routine is established allowing the temperature within a lossy sample to be controlled. A distribution of the temperature within the lossy sample is obtained by using a thermal imaging camera.
Keywords :
adhesives; cavity resonators; curing; finite difference time-domain analysis; finite volume methods; microwave ovens; polymers; FDTD solver; adhesives; bumps; cross-mapping routine; direct chip attach; encapsulants; evanescent fringing fields; finite-difference time-domain solver; flip-chip assembly; lossy sample; medical devices; microelectronics; microwave heating; microwave irradiation; open ended microwave oven; open waveguide cavity resonator; optoelectronics; polymer load; radio frequency curing; thermal imaging camera; thermal stresses; thermophysical analysis; underfills; unstructured finite volume method multiphysics package; variable frequency microwave curing; wafer-scale level packaging; Curing; Electromagnetic heating; Finite difference methods; Microwave devices; Microwave ovens; Packaging; Polymers; Radio frequency; Time domain analysis; Wafer bonding;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS, 2008. MEMS/MOEMS 2008. Symposium on
Conference_Location :
Nice
Print_ISBN :
978-2-35500-006-5
Type :
conf
DOI :
10.1109/DTIP.2008.4752943
Filename :
4752943
Link To Document :
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