Title :
ESD-induced internal core device failure: new failure modes in system-on-chip (SOC) designs
Author :
Huh, Yoon ; Bendix, Peter ; Min, Kyungjin ; Chen, Jau-Wen ; Narayan, Ravindra ; Johnson, Larry D. ; Voldman, Steven H.
Author_Institution :
Global Technol. Leader, Santa Clara, CA, USA
Abstract :
With MOSFET scaling, increased design complexity, and multiple system power domains, ESD failures occur in internal core areas which are not connected to external package pins. A review of the various internal core device failure mechanisms and design recommendations are presented.
Keywords :
electrostatic discharge; integrated circuit design; integrated circuit reliability; system-on-chip; ESD failures; electrostatic discharge; internal core device failure; system-on-chip design; Databases; Driver circuits; Electrostatic discharge; Lead compounds; Rails; Signal design; Stress; System-on-a-chip; Variable structure systems; Voltage;
Conference_Titel :
System-on-Chip for Real-Time Applications, 2005. Proceedings. Fifth International Workshop on
Print_ISBN :
0-7695-2403-6
DOI :
10.1109/IWSOC.2005.58
