• DocumentCode
    2390228
  • Title

    High quality factor silicon cantilever driven by PZT actuator for resonant based mass detection

  • Author

    Lu, Jun ; Ikehara, T. ; Zhang, Ye ; Mihara, T. ; Itoh, Takayuki ; Maeda, Ryutaro

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol. (AIST), Tsukuba
  • fYear
    2008
  • fDate
    9-11 April 2008
  • Firstpage
    60
  • Lastpage
    65
  • Abstract
    A high quality factor (Q-factor) piezoelectric lead zirconat titanate (PZT) film actuated single crystal silicon cantilever was proposed in this paper for resonant based ultra sensitive mass detection. Intrinsic energy dissipation and other negative effects from PZT film were successfully compressed by separating the PZT actuator from the resonant structure. Excellent Q-factor, which is comparable to silicon only cantilever and several times larger than latest reported Q-factor of integrated cantilevers, was successfully obtained under both atmospheric pressure and reduced pressures. For a 30 mum-wide 100 mum-long cantilever, Q-factor was measured as high as 1113 and 7279 under the pressure of 101.2 KPa and 35 Pa, respectively. Moreover, it was found that high mode vibration can be achieved for the pursuit of great Q-factor. However, support loss became significant because of the increase of PZT actuatorpsilas vibration amplitude. Therefore, an optimized structure using node-point actuation was discussed and suggested herein.
  • Keywords
    Q-factor; cantilevers; elemental semiconductors; lead compounds; mass measurement; micromechanical devices; piezoelectric actuators; piezoelectric thin films; silicon; vibrations; PZT; PZT actuator; Q-factor; Si; actuated single crystal silicon cantilever; energy dissipation; high mode vibration; integrated cantilevers; node-point actuation; piezoelectric lead zirconate titanate film; quality factor; resonant based ultrasensitive mass detection; size 100 mum; size 30 mum; Actuators; Atmospheric measurements; Energy dissipation; Piezoelectric films; Pressure measurement; Q factor; Resonance; Semiconductor films; Silicon; Titanium compounds;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS, 2008. MEMS/MOEMS 2008. Symposium on
  • Conference_Location
    Nice
  • Print_ISBN
    978-2-35500-006-5
  • Type

    conf

  • DOI
    10.1109/DTIP.2008.4752953
  • Filename
    4752953