Title :
Unified noise analysis of active CMOS mixers in submicron technology
Author :
Guo, Benqing ; Xiaolei Li ; Wen, Guangjun
Author_Institution :
Sch. of Commun. & Inf. Eng., UESTC, Chengdu, China
Abstract :
A unified noise figure expression incorporating the thermal noise and flicker noise has been explicitly derived for active CMOS mixers. The analysis takes the subthreshold conductance into account by adopting the latest continuous noise model and the simplified MOSFET model. The effect of output resistance is examined towards switching pairs. And good agreement is obtained between simulations and measurements.
Keywords :
CMOS integrated circuits; MOSFET; flicker noise; integrated circuit modelling; integrated circuit noise; mixers (circuits); radiofrequency integrated circuits; semiconductor device models; semiconductor device noise; thermal noise; MOSFET model; RF mixers; active CMOS mixer; continuous noise model; flicker noise; output resistance; submicron technology; subthreshold conductance; switching pairs; thermal noise; unified noise analysis; unified noise figure expression; Mixers; Noise; Tin;
Conference_Titel :
Intelligent Signal Processing and Communication Systems (ISPACS), 2010 International Symposium on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-7369-4
DOI :
10.1109/ISPACS.2010.5704700
