DocumentCode :
2390731
Title :
High aspect pattern formation by integration of micro inkjetting and electroless plating
Author :
Gian, P.W. ; Shan, Xuechuan ; Liang, Y.N. ; Lok, B.K. ; Lu, C.W. ; Ooi, B.L.
Author_Institution :
Singapore Inst. of Manuf. Technol. (SIMTech), Singapore
fYear :
2008
fDate :
9-11 April 2008
Firstpage :
162
Lastpage :
167
Abstract :
This paper reports on formation of high aspect micro patterns on low temperature co-fired ceramic (LTCC) substrates by integrating micro inkjetting with electroless plating. Micro inkjetting was realized by using an inkjetting printer that ejects ink droplets from a printhead. This printhead consists of a glass nozzle with a diameter of 50 mum and a piezoelectric transducer that is coated on the nozzle. The silver colloidal solution was inkjetted on a sintered CT800 ceramic substrate, followed by curing at 200degC for 60 minutes. As a result, the silver trace with a thickness of 200 nm was obtained. The substrate, with the ejected silver thin film as the seed layer, was then immersed into a preinitiator solution to coat a layer of palladium for enhancing the deposition of nickel. Electroless nickel plating was successfully conducted at a rate of 0.39 mum /min, and the thickness of traces was plated up to 84 mum. This study demonstrates that the integration of inkjetting with plating is an effective method to form high aspect patterns at the demand location.
Keywords :
electroless deposition; ink jet printing; metallic thin films; nickel; palladium; pattern formation; silver; Ag-Pd-Ni; curing; electroless plating; glass nozzle; high aspect pattern formation; low temperature co-fired ceramic substrates; microinkjetting; nickel deposition; palladium layer; piezoelectric transducer; printhead; silver thin film; silver trace; size 200 nm; size 50 mum; temperature 200 degC; time 60 min; Ceramics; Glass; Ink; Nickel; Pattern formation; Piezoelectric transducers; Printers; Silver; Substrates; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design, Test, Integration and Packaging of MEMS/MOEMS, 2008. MEMS/MOEMS 2008. Symposium on
Conference_Location :
Nice
Print_ISBN :
978-2-35500-006-5
Type :
conf
DOI :
10.1109/DTIP.2008.4752975
Filename :
4752975
Link To Document :
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