Six-port reflectometer capable of optimum performance

Author

Yeo, S.P. ; Lee, K.H.

Author_Institution

Dept. of Electr. Eng., Nat. Univ. of Singapore, Singapore

fYear

1989

fDate

25-27 Apr 1989

Firstpage

518

Lastpage

521

Abstract

The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of ±0.005 in magnitude and ±0.5° in phase are obtainable

Keywords

directional couplers; microwave reflectometry; reflectometers; waveguide components; directional coupler; optimum measurement performance; prototype; six-port reflectometer; symmetrical five-port waveguide junction; Bandwidth; Circuits; Directional couplers; Electromagnetic waveguides; Hardware; Instruments; Microwave measurements; Reflection; Waveguide junctions; Waveguide theory;

fLanguage

English

Publisher

ieee

Conference_Titel

Instrumentation and Measurement Technology Conference, 1989. IMTC-89. Conference Record., 6th IEEE

Conference_Location

Washington, DC

Type

conf

DOI

10.1109/IMTC.1989.36914

Filename

36914

Link To Document

https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2390756