Title :
Determining waveguide coupling efficiency by observing reflected light from the end face
Author :
Fan, Regis ; Delen, Nuri ; Hooker, Brian
Author_Institution :
Optoelectron. Comput. Syst. Center, Colorado Univ., Boulder, CO, USA
Abstract :
The amount of light coupled into a waveguide depends on end-face irregularities. We have developed a technique to assess the light coupling performance of waveguides by measuring their back reflected light characteristics. The reflected light can be separated into two parts, the specular and the diffuse reflected light. The amount of each gives us information on how well light can be coupled into a waveguide. This technique is especially useful in integrated optics made of polymer materials where end face quality is a strong function of the material preparation technique and processing
Keywords :
integrated optics; light reflection; light scattering; optical couplers; back reflected light characteristics; diffuse reflected light; end-face irregularities; integrated optics; light coupling performance; material preparation technique; polymer materials; specular reflected light; waveguide coupling efficiency; Atomic force microscopy; Optical coupling; Optical surface waves; Optical waveguides; Rough surfaces; Scanning electron microscopy; Surface roughness; Surface waves; Waveguide components; Waveguide theory;
Conference_Titel :
Electronic Components and Technology Conference, 1995. Proceedings., 45th
Conference_Location :
Las Vegas, NV
Print_ISBN :
0-7803-2736-5
DOI :
10.1109/ECTC.1995.515317